Gene-expression profiling with reduced numbers of transcript measurements

• Main Authors: LAMB JUSTIN, PECK DAVID D, SUBRAMANIAN ARAVIND, GOLUB TODD R
• Format: Patent
• Language: Chinese; English
• Published: 19.06.2013
• Subjects: CHEMISTRY; COMBINATORIAL CHEMISTRY; INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTEDFOR SPECIFIC APPLICATION FIELDS; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; LIBRARIES, e.g. CHEMICAL LIBRARIES, IN SILICOLIBRARIES; MEASURING; METALLURGY; PHYSICS; TESTING

The present invention provides compositions and methods for making and using a transcriptome-wide gene-expression profiling platform that measures the expression levels of only a select subset of the total number of transcripts. Because gene expression is believed to be highly correlated, direct measurement of a small number (for example, 1,000) of appropriately- selected transcripts allows the expression levels of the remainder to be inferred. The present invention, therefore, has the potential to reduce the cost and increase the throughput of full- transcriptome gene-expression profiling relative to the well-known conventional approaches that require all transcripts to be measured.