Gene-expression profiling with reduced numbers of transcript measurements

The present invention provides compositions and methods for making and using a transcriptome-wide gene-expression profiling platform that measures the expression levels of only a select subset of the total number of transcripts. Because gene expression is believed to be highly correlated, direct mea...

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Bibliographic Details
Main Authors LAMB JUSTIN, PECK DAVID D, SUBRAMANIAN ARAVIND, GOLUB TODD R
Format Patent
LanguageChinese
English
Published 19.06.2013
Subjects
CHEMISTRY
COMBINATORIAL CHEMISTRY
INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTEDFOR SPECIFIC APPLICATION FIELDS
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
LIBRARIES, e.g. CHEMICAL LIBRARIES, IN SILICOLIBRARIES
MEASURING
METALLURGY
PHYSICS
TESTING
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Summary:The present invention provides compositions and methods for making and using a transcriptome-wide gene-expression profiling platform that measures the expression levels of only a select subset of the total number of transcripts. Because gene expression is believed to be highly correlated, direct measurement of a small number (for example, 1,000) of appropriately- selected transcripts allows the expression levels of the remainder to be inferred. The present invention, therefore, has the potential to reduce the cost and increase the throughput of full- transcriptome gene-expression profiling relative to the well-known conventional approaches that require all transcripts to be measured.
Bibliography:Application Number: CN201180027991