X-ray detector with improved spatial gain uniformity and resolution and method of fabricating such x-ray detector

An X-raydetector (1) is proposed comprising a light detection arrangement (3) such as a CMOS photodetector, a scintillator layer (5) such as a CsI:Tl layer, a reflector layer (9) and a light emission layer (7) interposed betweenthe scintillator layer (5) and the reflector layer (9). The light emissi...

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Bibliographic Details
Main Authors CORNELISSEN HUGO JOHAN, VERSCHUREN COEN ADRIANUS, POORTER TIEMEN, STEINHAUSER HEIDRUN
Format Patent
LanguageChinese
English
Published 09.01.2013
Subjects
MEASUREMENT OF NUCLEAR OR X-RADIATION
MEASURING
PHYSICS
TESTING
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Summary:An X-raydetector (1) is proposed comprising a light detection arrangement (3) such as a CMOS photodetector, a scintillator layer (5) such as a CsI:Tl layer, a reflector layer (9) and a light emission layer (7) interposed betweenthe scintillator layer (5) and the reflector layer (9). The light emission layer (7) may comprise an OLED and may be made with a thickness of less than 50 [mu]m. Thereby, a sensitivity and resolutionofthe X-raydetector may be improved.
Bibliography:Application Number: CN2011820847