Method For Manufacturing A Nanoporous Ultra-low Dielectric Thin Film Including A High-temperature Ozone Treatment And Nanoporous Ultra-low Dielectric Thin Film Manufactured By The Method

Provided are a method for manufacturing a nanoporous ultra-low dielectric thin film including a high-temperature ozone treatment, and a nanoporous ultra-low dielectric thin film manufactured by the method. The method comprises: preparing a solution mixture by mixing a solution containing organic sil...

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Bibliographic Details
Main Authors SHIN BO RA, CHOI KYU YOON, KIM BUM SU, RHEE HEE WOO
Format Patent
LanguageChinese
English
Published 02.01.2013
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Summary:Provided are a method for manufacturing a nanoporous ultra-low dielectric thin film including a high-temperature ozone treatment, and a nanoporous ultra-low dielectric thin film manufactured by the method. The method comprises: preparing a solution mixture by mixing a solution containing organic silicate matrix and a solution containing reactive porogen; forming a thin film by coating a substrate with the solution mixture; and performing thermal treatment on the thin film, and performing ozone treatment during the thermal treatment. A nanoporous ultra-low dielectric thin film manufactured by the method can have a permittivity of 2.3 or less and a mechanical strength of 10 GPa or more by improving size and distribution of pores in the thin film by virtue of high-temperature ozone treatment and optimized treatment temperature.
Bibliography:Application Number: CN2011816921