System and method for using a single vector signal generator to verify device under test

• Main Authors: DIRK J. M. WALVIS, RAMAKRISHNA YELLAPANTULA, LI YINGHUI
• Format: Patent
• Language: Chinese; English
• Published: 19.12.2012
• Subjects: ELECTRIC COMMUNICATION TECHNIQUE; ELECTRICITY; TRANSMISSION; TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHICCOMMUNICATION

A system and a method are disclosed for testing a communication device. In accordance with the described invention, a single vector signal generator (VSG) is utilized to test manufactured 2x2, 3x2 and 4x2 MIMO wireless devices to identify possible manufacturing defects that may impair or disable the device under test (DUT) receivers from properly receiving constituted MIMO TX signals and accurately decoding the bits/symbols conveyed by transmitted TX signals. Disclosed embodiments may include a VSG coupled to a DUT. The VSG being configured to transmit data packets as a first codeword and a second codeword, wherein the VSG includes software and hardware architecture to manipulate the first codeword and the second codeword as emulated first and second waveforms, wherein the first waveform is different than the second waveform. The DUT being configured to receive the emulated first and second waveforms as prescribed signals from the VSG. The prescribed signals include a first received signal and a second receiv