Test method and device for high-light intensity and large-scale solar cell illumination linearity

The invention discloses a test method and a test device for high-light intensity and large-scale solar cell illumination linearity, which can accurately test short-circuit current or open circuit voltage illumination linearity when the light intensity variation scale is more than three orders of mag...

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Bibliographic Details
Main Author YANG YIQIANG
Format Patent
LanguageChinese
English
Published 21.03.2012
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:The invention discloses a test method and a test device for high-light intensity and large-scale solar cell illumination linearity, which can accurately test short-circuit current or open circuit voltage illumination linearity when the light intensity variation scale is more than three orders of magnitude and especially under the high light intensity of thousands of solar constants, measurement can be continuously carried out, and light intensity intervals can be freely set. The test device comprises a test light source and a test darkroom, wherein the test light source can generate light pulse; the test darkroom is provided with an orifice window; a light spectrum regulation light filter is arranged behind the orifice window; a beam splitter is aslant arranged; a tested solar cell and a standard solar cell are arranged on the light path of the transmission light of the beam splitter by one group of vertically-arranged neutral attenuation light filters which can be independently movedin or out of the light pa
Bibliography:Application Number: CN20111233740