Single-event-upset resistant scan structure D trigger capable of being reset synchronously

• Main Authors: LI PENG, LIU XIANGYUAN, LIANG BIN, CHI YAQING, CHEN JIANJUN, HE YIBAI, QIN JUNRUI, SUN YONGJIE, DU YANKANG
• Format: Patent
• Language: Chinese; English
• Published: 22.02.2012
• Subjects: BASIC ELECTRONIC CIRCUITRY; ELECTRICITY; PULSE TECHNIQUE

The invention discloses a single-event-upset resistant scan structure D trigger capable of being reset synchronously, and aims to improve the single-event-upset resistance of the single-event-upset resistant scan structure D trigger capable of being reset synchronously. The single-event-upset resist...