Thermal analyzer

• Main Authors: FUJIWARA HIROHITO, YAMADA KENTARO, NISHIMURA SHINYA
• Format: Patent
• Language: Chinese; English
• Published: 09.11.2011
• Subjects: BLASTING; FURNACES; FURNACES, KILNS, OVENS, OR RETORTS IN GENERAL; HEATING; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; KILNS; LIGHTING; MEASURING; MECHANICAL ENGINEERING; OPEN SINTERING OR LIKE APPARATUS; OVENS; PHYSICS; RETORTS; TESTING; WEAPONS

The invention relates to a thermal analyzer. To improve measurement accuracy by eliminating influence of a change of a temperature environment around a furnace of a thermal analyzer, the thermal analyzer includes a multilayer structure of at least two sealed layers for covering the furnace and its s...