Thermal analyzer

The invention relates to a thermal analyzer. To improve measurement accuracy by eliminating influence of a change of a temperature environment around a furnace of a thermal analyzer, the thermal analyzer includes a multilayer structure of at least two sealed layers for covering the furnace and its s...

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Bibliographic Details
Main Authors FUJIWARA HIROHITO, YAMADA KENTARO, NISHIMURA SHINYA
Format Patent
LanguageChinese
English
Published 09.11.2011
Subjects
BLASTING
FURNACES
FURNACES, KILNS, OVENS, OR RETORTS IN GENERAL
HEATING
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
KILNS
LIGHTING
MEASURING
MECHANICAL ENGINEERING
OPEN SINTERING OR LIKE APPARATUS
OVENS
PHYSICS
RETORTS
TESTING
WEAPONS
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Summary:The invention relates to a thermal analyzer. To improve measurement accuracy by eliminating influence of a change of a temperature environment around a furnace of a thermal analyzer, the thermal analyzer includes a multilayer structure of at least two sealed layers for covering the furnace and its surroundings so as to isolate the furnace and its surroundings from an outside. An interlayer of the multilayer structure is loaded with a substance having a heat capacity equal to the heat capacity of a gas inside the furnace.
Bibliography:Application Number: CN2011188494