Testing software in electronic device

Software in an electronic device can be tested using a combination of random testing and deterministic testing. In various embodiments, deterministic tests can run for a prescribed duration and/or a prescribed number of iterations before and/or after random testing. Test results can be weighted usin...

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Bibliographic Details
Main Authors KHAN ROSHAN, SUNDARAMURTHY PALANI, STAVROU EVAN R, RAJASHEKARA SHASHIDHAR, XUE KE, ENGSTROM G. ERIC
Format Patent
LanguageEnglish
Published 25.03.2015
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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Summary:Software in an electronic device can be tested using a combination of random testing and deterministic testing. In various embodiments, deterministic tests can run for a prescribed duration and/or a prescribed number of iterations before and/or after random testing. Test results can be weighted using a metric representing an amount of code that was stressed during testing. This metric can be determined by tracking software code that is loaded into memory during testing.
Bibliography:Application Number: CN201110087000