Method for manufacturing a mask having submillimetric apertures for a submillimetric electrically conductive grid, and mask and submillimetric electrically conductive grid

The invention relates to a method for manufacturing a mask having submillimetric apertures (1, 10), wherein: a first solution of colloidal nanoparticles in a first solvent is deposited for a mask layer, the particles having a given vitreous transition temperature Tg; the mask layer, referred to as t...

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Bibliographic Details
Main Authors VALENTIN EMMANUEL, TCHAKAROV SVETOSLAV, ZAGDOUN GEORGES, NGHIEM BERNARD
Format Patent
LanguageChinese
English
Published 24.08.2011
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Summary:The invention relates to a method for manufacturing a mask having submillimetric apertures (1, 10), wherein: a first solution of colloidal nanoparticles in a first solvent is deposited for a mask layer, the particles having a given vitreous transition temperature Tg; the mask layer, referred to as the first mask layer, is dried at a temperature lower than said temperature Tg until a mask having a two-dimensional array of submillimetric apertures is obtained, having a substantially straight edge and defining a so-called array mask area; a solid mask area is formed through liquid deposition of a second mask layer onto the surface thereof, the solid mask area being adjacent and contacting the array mask area; and/or at least one cache area is formed, said cache area contacting the array mask area; and/or a mask area, filled through liquid filling of the apertures of a part of the array mask area, is formed after drying the first mask layer. The invention also relates to the mask and to the electrically conductiv
Bibliography:Application Number: CN200980137636