Dip-based corrections for data reconstruction in three-dimensional surface-related multiple prediction

The invention relates to the DIP-based corrections for data reconstruction in three-dimensional surface-related multiple prediction. A best fitting trace in seismic data is determined for a desired trace to be reconstructed. A dip-based correction is calculated per trace and per sample for differenc...

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Bibliographic Details
Main Authors HEGGE ROBERTUS F, AARON PETER A, BARNES SIMON R, VAN BORSELEN ROALD G
Format Patent
LanguageChinese
English
Published 10.08.2011
Subjects
DETECTING MASSES OR OBJECTS
GEOPHYSICS
GRAVITATIONAL MEASUREMENTS
MEASURING
PHYSICS
TESTING
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Summary:The invention relates to the DIP-based corrections for data reconstruction in three-dimensional surface-related multiple prediction. A best fitting trace in seismic data is determined for a desired trace to be reconstructed. A dip-based correction is calculated per trace and per sample for differences in azimuth, common midpoint coordinates, and offset between the best fitting trace and the desired trace. The dip-based correction is applied to the best fitting trace to reconstruct the desired trace for 3D surface-related multiple prediction.
Bibliography:Application Number: CN201110022811