Test contact system for testing integrated circuits with packages having an array of signal and power contacts

A test fixture (120) is disclosed for electrically testing a device under test (130) by forming a plurality oftemporary mechanical and electrical connections between terminals (13 1 ) on the device under test (130) and contact pads (161) on the load board (160) The test fixture (120) has a replaceab...

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Bibliographic Details
Main Authors SHERRY JEFFREY C, OBERG RUSSELL F, WARWICK BRIAN, ALLADIO PATRICK J
Format Patent
LanguageChinese
English
Published 20.07.2011
Subjects
BASIC ELECTRIC ELEMENTS
CURRENT COLLECTORS
ELECTRICITY
LINE CONNECTORS
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Summary:A test fixture (120) is disclosed for electrically testing a device under test (130) by forming a plurality oftemporary mechanical and electrical connections between terminals (13 1 ) on the device under test (130) and contact pads (161) on the load board (160) The test fixture (120) has a replaceable membrane (150) that includes vias (151), with each via (151) being associated with a terminal (131) on the device under test (130) and a contact pad (161) on the load board (160) In some cases, each via (151) has an electrically conducting wall for conducting current between the terminal (131) and the contact pad (161) In some cases, each via (151) includes a sppng (152) that provides a mechanical resisting force to the terminal (131) when the device under test (130) is engaged with the test fixture (120).
Bibliography:Application Number: CN200980133465