Testing system

A test system includes a main selector, a first and a second switching connectors, a first and a second sub-selectors, and a processor. The main selector includes a number of first switches, a number of first contacts, and a number of second contacts. Each sub-selector includes a second switch, a th...

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Bibliographic Details
Main Authors HONG YONGCHENG, SU WANGDING, HE RUIXIONG
Format Patent
LanguageChinese
English
Published 09.10.2013
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:A test system includes a main selector, a first and a second switching connectors, a first and a second sub-selectors, and a processor. The main selector includes a number of first switches, a number of first contacts, and a number of second contacts. Each sub-selector includes a second switch, a third contact, and a fourth contact. The processor sends a first instruction and a second instruction to correspondingly control the main selector and a selected sub-selector.
Bibliography:Application Number: CN200910310547