Method for specific waveform matching in functional test of integrated circuit

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Bibliographic Details
Main Authors WANG JIN, QI JIANHUA, YU KUN, LIU YUANHUA, ZHANG ZHIYONG, YE SHOUYIN, ZHANG YING, XU HUI, NIU YONG, ZHAO DAJUN, TANG XUEFEI
Format Patent
LanguageChinese
English
Published 18.06.2014
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Bibliography:Application Number: CN20101269738