Method for dynamic aperture determination for three-dimensional surface-related multiple elimination

The invention relates to a method for dynamic aperture determination for three-dimensional surface-related multiple elimination. Dips are calculated for a series of sets of adjacent multiple contribution traces, from seismic data representative of subsurface formations, in the vicinity of a boundary...

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Bibliographic Details
Main Authors HEGGE ROBERTUS F, BORSELEN ROALD G. VAN
Format Patent
LanguageChinese
English
Published 05.01.2011
Subjects
DETECTING MASSES OR OBJECTS
GEOPHYSICS
GRAVITATIONAL MEASUREMENTS
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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Summary:The invention relates to a method for dynamic aperture determination for three-dimensional surface-related multiple elimination. Dips are calculated for a series of sets of adjacent multiple contribution traces, from seismic data representative of subsurface formations, in the vicinity of a boundary of an aperture of a multiple contribution gather, the seismic data acquired by deploying a plurality of seismic sensors proximate an area of the earth's subsurface to be evaluated, the seismic sensors generating at least one of an electrical and optical signal in response to seismic energy. The boundary of the aperture of the multiple contribution gather is recursively extended, based on the calculated dips. Multiple contribution traces in the multiple contribution gather with the extended aperture boundary are stacked to generate predicted multiple traces. The predicted multiple traces are subtracted from the seismic data to generate surface-related multiple attenuated data useful for imaging the subsurface forma
Bibliography:Application Number: CN20101222060