Shape measurement device probe and shape measurement device

A linear movement portion (6) is supported by attachment portion (2) so as to be linearly movable only in a vertical direction. A swing movement portion (3) includes an arm (121) having at a tip end thereof a stylus (122) for contacting with a surface to be measured of a measuring object. A connecti...

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Bibliographic Details
Main Authors HATTA KENICHIRO, FUNABASHI TAKANORI
Format Patent
LanguageChinese
English
Published 18.04.2012
Subjects
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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Summary:A linear movement portion (6) is supported by attachment portion (2) so as to be linearly movable only in a vertical direction. A swing movement portion (3) includes an arm (121) having at a tip end thereof a stylus (122) for contacting with a surface to be measured of a measuring object. A connection mechanism (4) connects the swing movement portion to the linear movement portion so that the swing movement portion can swing with respect to the supporting point portion by fitting an apical end of a supporting point member (42) provided in the swing movement portion into a groove (41a) formed in a mounting platform (41) provided in the linear movement portion. Swing-side and non-swing-side magnets (51, 52) generate magnetic attractive forces which cause a biasing force to the swing movement portion so that the arm is oriented in the vertical direction. Magnetic forces generated between movable-side and fixed-side magnets (71, 72) cause a biasing force in the vertical upward direction to the linear movement por
Bibliography:Application Number: CN201010136354