Method and device for the automated comparison of two sets of measurement values
A method and a device are for an automated comparison of at least two sets of measuring values. The measuring values of the two sets are assigned respectively to one class from a finite number of classes defined by indices so that a frequency distribution is defined respectively for each of the two...
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Main Author | |
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Format | Patent |
Language | Chinese English |
Published |
17.12.2014
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Subjects | |
Online Access | Get full text |
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Summary: | A method and a device are for an automated comparison of at least two sets of measuring values. The measuring values of the two sets are assigned respectively to one class from a finite number of classes defined by indices so that a frequency distribution is defined respectively for each of the two sets, which frequency distribution indicates for each class a frequency of the measuring values assigned to this class. A distance measure reflecting a similarity or dissimilarity between the two sets of measuring values between these frequency distributions is calculated as a function of a final value of a first auxiliary value termed here match by way of example. The first auxiliary value match is calculated by an algorithm using two sets of variables in that, with a given maximum distance dmax 1 for all integral distances d with 0 d dmax, beginning with d=0 and continuing to larger distances d, respectively for all indices i and j at a distance from each other by the distance d. A current value of a further auxi |
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Bibliography: | Application Number: CN200880113025 |