Method for improving Schottky barrier of gallium nitride-based field effect transistor
The invention discloses a method for improving a Schottky barrier of a gallium nitride-based field effect transistor, belonging to the technical field of manufacture of semiconductor material device. The method comprises the following steps: cleaning the gallium nitride-based field effect transistor...
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Main Authors | , , , , , |
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Format | Patent |
Language | Chinese English |
Published |
12.05.2010
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Subjects | |
Online Access | Get full text |
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Summary: | The invention discloses a method for improving a Schottky barrier of a gallium nitride-based field effect transistor, belonging to the technical field of manufacture of semiconductor material device. The method comprises the following steps: cleaning the gallium nitride-based field effect transistor; and storing the cleaned gallium nitride-based field effect transistor under the protection of nitrogen at high temperature. By means of the invention, the height of the Schottky barrier of gallium nitride-based field effect transistor is increased, the reverse leakage f the Schottky barrier of gallium nitride-based field effect transistor is reduced, and the power characteristic and the breakdown characteristic of the gallium nitride-based field effect transistor are improved; therefore, the problem of parameter drift of the gallium nitride-based field effect transistor in the work is solved, and the stability and reliability of the gallium nitride-based field effect transistor are improved. |
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Bibliography: | Application Number: CN20091303939 |