ACFM intelligent visual defect detection system

• Main Authors: NI CHUNSHENG, LI WEI, LI WENYAN, CHEN GUOMING
• Format: Patent
• Language: Chinese; English
• Published: 05.05.2010
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PHYSICS; TESTING

The invention discloses an intelligent visual defect detection system based on an AC magnetic field. The system comprises a probe, an auxiliary circuit and system detection software and uses a defect quantification and shape reconstruction algorithm. An excitation part of the probe adopts a double-U-shaped structural design and consists of a mangan zinc ferrite iron core and two sets of orthogonal current-carrying coils, a detection part adopts a two-dimensional array structure, and the array probe adopts a lifting-releasing type traveling mode. The hardware processing of detection signals comprises signal conditionings such as amplification, filtering, and the like and also introduces an original excitation signal as a reference signal to carry out phase sensitive detection and low-pass filtering on the detection signals. The signals are sent into a computer through an A/D acquisition card, then the detection software is used for carrying out digital filtering and correlation analysis on the signals to draw