Test vessel and test arrangement for a monitoring device for vessels

• Main Author: WIDERA CARSTEN
• Format: Patent
• Language: Chinese; English
• Published: 27.05.2009
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

The invention describes a method for examining workpieces in a spatially resolved and destruction-free manner using at least one measuring sensor which is guided over a technical surface of the workpiece to be examined and is able to detect local material inhomogeneities, local unsound areas of material and/or local material structures within the workpiece. The invention is distinguished by the fact that, proceeding from a starting position at which the at least one measuring sensor is positioned on the surface of the workpiece and a first volume region of the workpiece, which can be detected by the measuring sensor and is represented by a first measurement signal, is detected, a movement trajectory is determined, by moving the measuring sensor along the workpiece surface into a second position, on the basis of a comparison of the first measurement signal with a second measurement signal which is obtained at the second position and represents a second volume region, wherein the first and second volume regions