Material tester based on system chip
The invention discloses a system chip based material tester, which comprises a displacement, force data acquisition part, a converter control part, a minimum system part, a slave computer man-machine interface part and a host computer man-machine interface part, wherein a CPLD position data acquisit...
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Format | Patent |
Language | Chinese English |
Published |
31.08.2011
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Online Access | Get full text |
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Abstract | The invention discloses a system chip based material tester, which comprises a displacement, force data acquisition part, a converter control part, a minimum system part, a slave computer man-machine interface part and a host computer man-machine interface part, wherein a CPLD position data acquisition module in the displacement, force data acquisition part is connected with a system chip in the minimum system part through a data and control bus; a conversion control in the converter control part is connected with the system chip in the minimum system part through a common I/O port and a DA port; the system chip in the minimum system part, connected with a keyboard module in the slave computer man-machine interface part through a IIC bus, connected with a minitype printer in the slave computer man-machine interface part through a serial port, is connected with a LCD liquid crystal module in the slave computer man-machine interface part through the data and control bus. The invention has the advantages of low |
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AbstractList | The invention discloses a system chip based material tester, which comprises a displacement, force data acquisition part, a converter control part, a minimum system part, a slave computer man-machine interface part and a host computer man-machine interface part, wherein a CPLD position data acquisition module in the displacement, force data acquisition part is connected with a system chip in the minimum system part through a data and control bus; a conversion control in the converter control part is connected with the system chip in the minimum system part through a common I/O port and a DA port; the system chip in the minimum system part, connected with a keyboard module in the slave computer man-machine interface part through a IIC bus, connected with a minitype printer in the slave computer man-machine interface part through a serial port, is connected with a LCD liquid crystal module in the slave computer man-machine interface part through the data and control bus. The invention has the advantages of low |
Author | CHEN CHANGMING ZHAO SHAOHUA TANG BINHONG YI JIANJUN XU SHUIYUAN |
Author_xml | – fullname: YI JIANJUN – fullname: XU SHUIYUAN – fullname: TANG BINHONG – fullname: ZHAO SHAOHUA – fullname: CHEN CHANGMING |
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Notes | Application Number: CN20081207562 |
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Snippet | The invention discloses a system chip based material tester, which comprises a displacement, force data acquisition part, a converter control part, a minimum... |
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SubjectTerms | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
Title | Material tester based on system chip |
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