Material tester based on system chip

• Main Authors: YI JIANJUN, XU SHUIYUAN, TANG BINHONG, ZHAO SHAOHUA, CHEN CHANGMING
• Format: Patent
• Language: Chinese; English
• Published: 31.08.2011
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

The invention discloses a system chip based material tester, which comprises a displacement, force data acquisition part, a converter control part, a minimum system part, a slave computer man-machine interface part and a host computer man-machine interface part, wherein a CPLD position data acquisition module in the displacement, force data acquisition part is connected with a system chip in the minimum system part through a data and control bus; a conversion control in the converter control part is connected with the system chip in the minimum system part through a common I/O port and a DA port; the system chip in the minimum system part, connected with a keyboard module in the slave computer man-machine interface part through a IIC bus, connected with a minitype printer in the slave computer man-machine interface part through a serial port, is connected with a LCD liquid crystal module in the slave computer man-machine interface part through the data and control bus. The invention has the advantages of low