Material tester based on system chip
The invention discloses a system chip based material tester, which comprises a displacement, force data acquisition part, a converter control part, a minimum system part, a slave computer man-machine interface part and a host computer man-machine interface part, wherein a CPLD position data acquisit...
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Main Authors | , , , , |
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Format | Patent |
Language | Chinese English |
Published |
31.08.2011
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Subjects | |
Online Access | Get full text |
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Summary: | The invention discloses a system chip based material tester, which comprises a displacement, force data acquisition part, a converter control part, a minimum system part, a slave computer man-machine interface part and a host computer man-machine interface part, wherein a CPLD position data acquisition module in the displacement, force data acquisition part is connected with a system chip in the minimum system part through a data and control bus; a conversion control in the converter control part is connected with the system chip in the minimum system part through a common I/O port and a DA port; the system chip in the minimum system part, connected with a keyboard module in the slave computer man-machine interface part through a IIC bus, connected with a minitype printer in the slave computer man-machine interface part through a serial port, is connected with a LCD liquid crystal module in the slave computer man-machine interface part through the data and control bus. The invention has the advantages of low |
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Bibliography: | Application Number: CN20081207562 |