Mark sensor and methods for evaluation of markers

The invention relates to a mark sensor (120,220,400,500), comprising: a detection unit, used for detecting marks on processing materials (101) and generating detection results based on the detected marks; at least one circuit output terminal (222), used for outputting the detected data; an analyzing...

Full description

Saved in:
Bibliographic Details
Main Authors SCHULTZE STEPHAN, SCHNABEL HOLGER, DITTMAIER ULRICH
Format Patent
LanguageChinese
English
Published 22.04.2009
Subjects
Online AccessGet full text

Cover

Loading…
More Information
Summary:The invention relates to a mark sensor (120,220,400,500), comprising: a detection unit, used for detecting marks on processing materials (101) and generating detection results based on the detected marks; at least one circuit output terminal (222), used for outputting the detected data; an analyzing unit, used for determining the absolute output data of the detected marks based on the detection data generated by the detection unit; and an interface (221) used for outputting the absolute output data; and further to a method for analyzing the marks detected by the detection unit on the processing materials, comprising the following steps: generating detection data by the detection unit based on the detected marks; outputting the detection data to the at least one circuit output terminal; transmitting the detected data to the analyzing unit in the mark sensor; determining the absolute output data of the detected marks based on the detection data generated by the detection unit in the analyzing unit; and outputti
Bibliography:Application Number: CN20081149946