Silicon-based double hetero-junction visible blind ultraviolet detector and manufacturing method thereof
The invention discloses a silicon-based double heterojunction visible-blind UV detector and a manufacturing method thereof. The detector comprises a p-Si substrate, an MgO insulating layer, an n-ZnO-based thin film layer, an n-type ohmic contact electrode and a p-type ohmic contact electrode. The ma...
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Main Authors | , , , , |
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Format | Patent |
Language | Chinese English |
Published |
15.04.2009
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Subjects | |
Online Access | Get full text |
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Summary: | The invention discloses a silicon-based double heterojunction visible-blind UV detector and a manufacturing method thereof. The detector comprises a p-Si substrate, an MgO insulating layer, an n-ZnO-based thin film layer, an n-type ohmic contact electrode and a p-type ohmic contact electrode. The manufacturing method of the detector comprises the following steps: the MgO insulating layer is grown on a clean Si substrate by an epitaxial growth device, and the n-ZnO-based thin film layer is grown on the MgO insulating layer; the n-type ohmic contact electrode is deposited on the n-ZnO-based thin film layer by the well-known photo lithography and the well-known metal thin film deposition method; and the p-type ohmic contact electrode is deposited on the back face of the Si substrate. By the manufacturing method, high-performance visible-blind UV detectors can be manufactured on semiconductor Si substrates which are cheap and have mature integrated process. |
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Bibliography: | Application Number: CN20081227958 |