X-ray diffraction apparatus and X-ray diffraction method

In an X-ray diffraction method using the parallel beam method, an X-ray parallel beam (24) is incident on a sample (26), and diffracted X-rays (28) from the sample (26) are reflected at a mirror (18) and thereafter detected by an X-ray detector (20). The reflective surface (19) of the mirror (18) ha...

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Bibliographic Details
Main Author TORAYA HIDEO
Format Patent
LanguageChinese
English
Published 08.04.2009
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:In an X-ray diffraction method using the parallel beam method, an X-ray parallel beam (24) is incident on a sample (26), and diffracted X-rays (28) from the sample (26) are reflected at a mirror (18) and thereafter detected by an X-ray detector (20). The reflective surface (19) of the mirror (18) has a shape of an equiangular spiral that has a center located on the surface of the sample (26). A crystal lattice plane that causes reflection is parallel to the reflective surface (19) at any point on the reflective surface (19). The X-ray detector (20) is one-dimensional position sensitive in a plane parallel to the diffraction plane. A relative positional relationship between the mirror (18) and the X-ray detector (20) is determined so that reflected X-rays (40) from different points on the reflective surface (19) of the mirror (18) reach different points on the X-ray detector (20) respectively. This X-ray diffraction method is superior in angular resolution, and is small in X-ray intensity reduction, and is sim
Bibliography:Application Number: CN20081179920