Register circuit, scanning register circuit applying same and scanning method

• Main Authors: XIE SHANGZHI, SHEN ZIBIN
• Format: Patent
• Language: Chinese; English
• Published: 19.03.2008
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

The present invention provides a register circuit, which includes a latch circuit for latching an input data and generating an output data; an input signal selecting circuit, which is coupled with a non-testing data and a testing date respectively, and is used to selectively output the non-testing d...