Tester and method for testing unified series interface command

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Bibliographic Details
Main Authors LU XIN, WENG SHIFANG
Format Patent
LanguageChinese
English
Published 20.03.2013
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Bibliography:Application Number: CN2006134116