Test simulator, test simulation program and recording medium

• Main Author: TADA HIDEKI,HORI MITSUO,KATAOKA TAKAHIRO
• Format: Patent
• Language: English
• Published: 29.08.2007
• Subjects: CALCULATING; COMPUTING; COUNTING; ELECTRIC DIGITAL DATA PROCESSING; MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

There is provided a test simulator simulating a test of a semiconductor device, which includes: a test pattern holding means for holding an existing test pattern to be supplied to the semiconductor device; a device output holding means for previously holding an output to be obtained from the semiconductor device when the existing test pattern is supplied; a test pattern generating means for generating a new test pattern to be supplied to the semiconductor device; a test pattern deciding means for deciding whether the new test pattern is equal to the existing test pattern; and a simulation skipping means for skipping at least a part of a simulation test by reading an output from the device output holding means and using the output as an output for the new test pattern without supplying the new test pattern to the semiconductor device when the test patterns are equal to each other.A test simulator is provided for simulating a semiconductor device test. The test simulator is provided with a test pattern holding means for holding an existing test pattern to be given to a semiconductor device; a device output holding means for previously holding an output to be obtained from the semiconductor device when the existing test pattern is given; a test pattern generating means for generating a new test pattern to be given to the semiconductor device; a test pattern judging means for judging whether the new test pattern is the same as the existing test pattern; and a simulation skipping means for skipping at least a part of a simulation test by reading out the output from the device output holding means without giving the new test pattern to the semiconductor device when the test patterns are same and by permitting the read out output to be an output for the new test pattern.