Elastic body inspection method, inspection device, and dimension prediction program

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Bibliographic Details
Main Authors NEHAGI TAKATOSHI, YAMADA TOMOHIRO, HATTA TETSUYA, KOMAZAWA MASATO
Format Patent
LanguageChinese
English
Published 29.07.2009
Subjects
ELECTRICITY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Bibliography:Application Number: CN200580013310