Probe for testing flat panel display and manufacturing method thereof

PURPOSE: A probe sheet for inspecting a flat display device, a method manufacturing the same and a probe assembly provided with the same are provided to positively cope with a current fine pitch in a highly integrated flat display device. CONSTITUTION: A probe sheet for inspecting a flat display dev...

Full description

Saved in:
Bibliographic Details
Main Author GOO CHUL-HWAN,JO BYUNG-HO,JO YONG-HWI,KIM KI-JOON,LEE JUNG-BAE,LEE OUG-KI,OH SUNG-YOUNG
Format Patent
LanguageEnglish
Published 17.10.2007
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
Online AccessGet full text

Cover

Abstract PURPOSE: A probe sheet for inspecting a flat display device, a method manufacturing the same and a probe assembly provided with the same are provided to positively cope with a current fine pitch in a highly integrated flat display device. CONSTITUTION: A probe sheet for inspecting a flat display device includes an inspecting tip and a plurality of unit contact member(30). Each of the unit contact member(30) is provided with a beam unit(20) in the form of bar shape, a contact tip(24a) and a connection tip(24b). The beam unit(20) is integrated at one side of the inspection tip below a predetermined thin film(22).
AbstractList PURPOSE: A probe sheet for inspecting a flat display device, a method manufacturing the same and a probe assembly provided with the same are provided to positively cope with a current fine pitch in a highly integrated flat display device. CONSTITUTION: A probe sheet for inspecting a flat display device includes an inspecting tip and a plurality of unit contact member(30). Each of the unit contact member(30) is provided with a beam unit(20) in the form of bar shape, a contact tip(24a) and a connection tip(24b). The beam unit(20) is integrated at one side of the inspection tip below a predetermined thin film(22).
Author GOO CHUL-HWAN,JO BYUNG-HO,JO YONG-HWI,KIM KI-JOON,LEE JUNG-BAE,LEE OUG-KI,OH SUNG-YOUNG
Author_xml – fullname: GOO CHUL-HWAN,JO BYUNG-HO,JO YONG-HWI,KIM KI-JOON,LEE JUNG-BAE,LEE OUG-KI,OH SUNG-YOUNG
BookMark eNqNyr0KwjAUBtAMOvj3Dhd3oRJRnEPFSRzcy7X9YgvpTUhuB99eBB_A6SxnaWYSBQtT33N8gnzMpCg6yIt8YKXEgkDdUFLgN7F0NLJMnlud8jeN0D52pD0yol-buedQsPm5MttL_XDXHVJsUBK3EGjjbvuqsgd7Pp6cs3-lD3s-NZc
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
Physics
ExternalDocumentID CN100343967CC
GroupedDBID EVB
ID FETCH-epo_espacenet_CN100343967CC3
IEDL.DBID EVB
IngestDate Fri Jul 19 15:45:23 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_CN100343967CC3
Notes Application Number: CN200380103797
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20071017&DB=EPODOC&CC=CN&NR=100343967C
ParticipantIDs epo_espacenet_CN100343967CC
PublicationCentury 2000
PublicationDate 20071017
PublicationDateYYYYMMDD 2007-10-17
PublicationDate_xml – month: 10
  year: 2007
  text: 20071017
  day: 17
PublicationDecade 2000
PublicationYear 2007
RelatedCompanies PHICOM CORP
RelatedCompanies_xml – name: PHICOM CORP
Score 2.6904385
Snippet PURPOSE: A probe sheet for inspecting a flat display device, a method manufacturing the same and a probe assembly provided with the same are provided to...
SourceID epo
SourceType Open Access Repository
SubjectTerms BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
Title Probe for testing flat panel display and manufacturing method thereof
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20071017&DB=EPODOC&locale=&CC=CN&NR=100343967C
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dS8MwED_m_HzTqahTCSJ9Kw6zNO3DEJZ2DGHdkCl7G2najsnMhu0Q_3svcXM-7TWBkDtyuY_c7xeA-9QwvMiAuspnzG36nuf6TAXuY54oyWgaKIut6sVe97X5PGKjCryvsTCWJ_TLkiOiRSm099Le14tNESu0vZXFQzLFoflTZ9gKnXV2zM0Jc8J2Kxr0w75whGiJ2IlfMNZtUPS9Hhc7sGvCaMOzH721DSpl8d-ldI5hb4Cr6fIEKpmuwaFY_7xWg4Pe6sG7Bvu2Q1MVOLiywuIUooHB8BAMN0lpSDL0hOQzWRI07GxG0mmxmMlvInVKPqReGuiCxSKS39-iiQn5snl-BnedaCi6Lu5s_KeGsYg3Qgh6DlU919kFEJonnKcckymfNlEwyfJG4vNASkwVqGKXUN-y0NXW2Toc2WKmaeHg11AtP5fZDXrhMrm16vsBHo6LDw
link.rule.ids 230,309,786,891,25594,76903
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1LTwIxEJ4gPvCmqFHx0Rizt43Gbre7B2JCF4IKCzFouJHuy2CwEHeJ8d87rSCeuE6Tpm06nfmm880AXCe6wov0qR17jNmO57q2x2LfvsuiWDKa-LHhVnVDt_3iPA7ZsATvSy6MqRP6ZYojokbFqO-Fea9nqyBWYHIr85tojKLpfWtQD6wlOub6hllBo97s94KesISoi9AKn9HXvaVoe10uNmCTIyQ0UOm1oVkps_8mpbUHW32cTRX7UEpVFSpi2XmtCjvdxYd3FbZNhmaco3ChhfkBNPuaw0PQ3SSFLpKh3kg2kQVBxU4nJBnns4n8JlIl5EOquaYuGC4i-e0WTbTLl06zQ7hqNQeibePKRn_HMBLhahOCHkFZTVV6DIRmEecJRzDlUYf5jmTZbeRxX0qECjRmJ1BbM9Hp2tFLqLQH3c6o8xA-1WDXBDZ1Ogc_g3LxOU_P0SIX0YU5yh_EYI35
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=Probe+for+testing+flat+panel+display+and+manufacturing+method+thereof&rft.inventor=GOO+CHUL-HWAN%2CJO+BYUNG-HO%2CJO+YONG-HWI%2CKIM+KI-JOON%2CLEE+JUNG-BAE%2CLEE+OUG-KI%2COH+SUNG-YOUNG&rft.date=2007-10-17&rft.externalDBID=C&rft.externalDocID=CN100343967CC