Probe for testing flat panel display and manufacturing method thereof

PURPOSE: A probe sheet for inspecting a flat display device, a method manufacturing the same and a probe assembly provided with the same are provided to positively cope with a current fine pitch in a highly integrated flat display device. CONSTITUTION: A probe sheet for inspecting a flat display dev...

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Bibliographic Details
Main Author GOO CHUL-HWAN,JO BYUNG-HO,JO YONG-HWI,KIM KI-JOON,LEE JUNG-BAE,LEE OUG-KI,OH SUNG-YOUNG
Format Patent
LanguageEnglish
Published 17.10.2007
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
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Summary:PURPOSE: A probe sheet for inspecting a flat display device, a method manufacturing the same and a probe assembly provided with the same are provided to positively cope with a current fine pitch in a highly integrated flat display device. CONSTITUTION: A probe sheet for inspecting a flat display device includes an inspecting tip and a plurality of unit contact member(30). Each of the unit contact member(30) is provided with a beam unit(20) in the form of bar shape, a contact tip(24a) and a connection tip(24b). The beam unit(20) is integrated at one side of the inspection tip below a predetermined thin film(22).
Bibliography:Application Number: CN200380103797