Method and device for inspecting an array of electronic components

The invention provides an apparatus and method for inspecting an array of electronic components. The apparatus comprises a scanning device adapted to capture images of at least one surface of each of the respective components, whereby to inspect said surface. The scanning device may be a line scanni...

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Bibliographic Details
Main Author CHEN XU QIONG,LEUNG WING HONG,JANSSON DAVID ANDERS
Format Patent
LanguageEnglish
Published 29.08.2007
Subjects
BASIC ELECTRIC ELEMENTS
CALCULATING
COMPUTING
COUNTING
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
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Summary:The invention provides an apparatus and method for inspecting an array of electronic components. The apparatus comprises a scanning device adapted to capture images of at least one surface of each of the respective components, whereby to inspect said surface. The scanning device may be a line scanning device.
Bibliography:Application Number: CN200410001160