Elektronenoptische Vorrichtung

• Main Author: EDWARD HAINE,MICHAEL
• Format: Patent
• Language: German
• Published: 15.04.1960
• Subjects: APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM]; BASIC ELECTRIC ELEMENTS; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS; ELECTRICITY; GYROSCOPIC INSTRUMENTS; MEASURING; MEASURING DISTANCES, LEVELS OR BEARINGS; NAVIGATION; PHOTOGRAMMETRY OR VIDEOGRAMMETRY; PHYSICS; SCANNING-PROBE TECHNIQUES OR APPARATUS; SURVEYING; TESTING

832,500. Electron beam deflecting apparatus. ASSOCIATED ELECTRICAL INDUSTRIES Ltd. Nov. 21, 1956 [Dec. 12, 1955], No. 35600/55. Class 39(1). In a cathode ray tube such as a reflection microscope the beam is given an alignment deflection in two perpendicular directions by two pairs of combined electrostatic and magnetic deflection means spaced along the beam the first pair of means giving electrostatic deflection in one direction and magnetic deflection at right angles to this direction, and the second pair of means reversing the deflections of the first pair of means so that the direction of impact of the beam on the target is altered without altering the point of impact. In the form described the plates 3, 31, 4, 41 serve as polepieces of iron cored electromagnets 8, 13, 9, 14, 10, 15, 11, 16 supported by yoke 12, and are insulated from the cores 8, 9, 10, 11 so that they can also serve as electrostatic deflecting plates. The electric deflection is first to the right and then back to the axis in the plane of the paper while the magnetic deflections are similar but in a plane perpedicular to the plane of the paper. A prior art device in which an electron gun is movable laterally to alter the direction but not the point of impact the centre of curvature of the spherical surface lying in the plane of the target, is referred to.