DYNAMIC PULSED EDDY CURRENT PROBE

The present invention provides methods and systems for a dynamic pulsed eddy current probe that includes at least two magnetizing yokes having a first leg and a second leg, and a coil assembly comprising a coil, wherein the second leg of the at least two magnetizing yokes is positioned within the co...

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Bibliographic Details
Main Authors MALINOWSKI, OWEN MICHAEL, KOENIG, KAMALU MICHAEL-STANLEY
Format Patent
LanguageEnglish
French
Published 17.08.2017
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:The present invention provides methods and systems for a dynamic pulsed eddy current probe that includes at least two magnetizing yokes having a first leg and a second leg, and a coil assembly comprising a coil, wherein the second leg of the at least two magnetizing yokes is positioned within the coil assembly. La présente invention concerne des procédés et des systèmes pour une sonde à courant de Foucault pulsé dynamique qui comprend au moins deux culasses de magnétisation ayant une première branche et une seconde branche, et un ensemble formant bobine comprenant une bobine, la seconde branche du ou des culasses de magnétisation étant positionnées dans l'ensemble formant bobine.
Bibliography:Application Number: CA20163014437