INTEGRATED CIRCUIT WITH PROGRAMMABLE LOGIC ANALYZER, ENHANCED ANALYZING AND DEBUGGING CAPABILITIES AND METHOD

An integrated circuit including a logic analyzer with enhanced analyzing and debugging capabilities and a method therefor. In one embodiment, an integrated circuit includes a logic analyzer having a first input receiving a plurality of signals and an output for providing an indication of a detection...

Full description

Saved in:
Bibliographic Details
Main Authors BAILEY, JAMES RAY, CASE, CHRISTOPHER WILSON, SHARPE, JAMES PATRICK
Format Patent
LanguageEnglish
French
Published 15.03.2012
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
Online AccessGet full text

Cover

More Information
Summary:An integrated circuit including a logic analyzer with enhanced analyzing and debugging capabilities and a method therefor. In one embodiment, an integrated circuit includes a logic analyzer having a first input receiving a plurality of signals and an output for providing an indication of a detection, by the logic analyzer, of at least one trigger event; and a built in self test block having a first input for receiving one or more of the signals appearing at the first input of the logic analyzer, a second input coupled to the output of the logic analyzer for selectively enabling the BIST block, the BIST block generating and maintaining a signature based upon the first and second inputs thereof.
Bibliography:Application Number: CA20112807323