X-RAY DIFFRACTION INSTRUMENT

• Main Authors: HATOU, HISAMITU, KIKUCHI, TOSHIKAZU, WANG, YUN
• Format: Patent
• Language: English; French
• Published: 18.02.2013
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASUREMENT OF NUCLEAR OR X-RADIATION; MEASURING; MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE; PHYSICS; TESTING

There is provided an X-ray diffraction instrument including: a two-dimensional plate-like X-ray detector; an X-ray emitter integrated with the X-ray detector so as to penetrate the plate of the X-ray detector; a cylinder-like shield to define an orientation of the X-ray emitter and to prevent X-ray leakage, the X-ray detector being attached to one open end of the cylinder-like shield; and a standard powder attachment device to attach a standard powder for X--ray diffraction measurement to a surface of an object to be measured. The X-ray diffraction instrument can perform an X-ray diffraction measurement to an object larger than the X-ray detector thereof. The invented X-ray diffraction instrument is small in size, and can perform accurate X-ray diffraction measurement of stationary immovable objects without limitation on an orientation of the measurement surface. In addition, X-ray leakage is prevented for operator safety.