ULTRASONIC INSPECTION APPARATUS

• Main Authors: IKEDA, TAKAHIRO, ISOBE, HIDEO, YAMANE, NORIYUKI, ARAI, RYOICHI
• Format: Patent
• Language: English; French
• Published: 03.09.2009
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

Provided is an ultrasonic inspection device capable of using high-precision scanning path information in an ultrasonic flaw detection test. The ultrasonic inspection device is provided with a measurement unit for measuring a distance to the surface of an object to be inspected and acquiring measurement data composed of a point group, a shape data generation unit for generating shape data relating to the surface of the object to be inspected composed of a point group of points having positional information represented by a coordinate system of a scanner mechanism by using the measurement data composed of the point group acquired by the measurement unit, and a path information generating unit for finding a pass point on the surface of the object to be inspected which composes a scanning path of an ultrasonic transducer by using the shape data generated by the shape data generation unit and generating scanning path information relating to the ultrasonic transducer such that the normal vector of the pass point on the surface of the object to be inspected and an open surface of the ultrasonic transducer intersect at right angles and that the distance between the pass point and the center of the open surface of the ultrasonic transducer is constant.