Método e aparelho para classificação de partículas

One aspect of the invention concerns a method of classifying particles according to their composition. In the method the particles (12) are irradiated with electromagnetic radiation, typically X-radiation, at respective first and second energy levels. First and second values are derived which are re...

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Bibliographic Details
Main Authors ULF ANDERS STAFFAN TAPPER, JACEK GUZEK, SUDHIR NUNDHLAL SURUJHLAL
Format Patent
LanguagePortuguese
Published 03.10.1995
Edition5
Subjects
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Summary:One aspect of the invention concerns a method of classifying particles according to their composition. In the method the particles (12) are irradiated with electromagnetic radiation, typically X-radiation, at respective first and second energy levels. First and second values are derived which are representative of the attenuation of the radiation by each particle. A third value is then derived as the difference between or ratio of the first and second values, and the particles are classified according to whether the third value is indicative of the presence in the particles of a particular substance. In one application of the method it can be used to classify diamondiferous kimberlite into a fraction consisting of kimberlite particles containing diamond inclusions and a fraction consisting of barren kimberlite particles. A rotatable gantry (22) carries the source (24) and the spaced detectors (26) to allow tomograms to be taken by a CAT or laminographic technique.
Bibliography:Application Number: BR19959500038