Polishing pads for a semiconductor substrate

A polishing pad for polishing a semiconductor wafer which includes an open-celled, porous substrate having sintered particles of synthetic resin. The porous substrate is a uniform, continuous and tortuous interconnected network of capillary passage. The pores of the porous substrate have an average...

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Bibliographic Details
Main Authors SRIRAM P. ANJUR, ROLAND K. SEVILLA, FRANK B. KAUFMAN
Format Patent
LanguageEnglish
Published 01.02.2000
Edition7
Subjects
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Summary:A polishing pad for polishing a semiconductor wafer which includes an open-celled, porous substrate having sintered particles of synthetic resin. The porous substrate is a uniform, continuous and tortuous interconnected network of capillary passage. The pores of the porous substrate have an average pore diameter of from about 5 to about 100 microns which enhances pad polishing performance.
Bibliography:Application Number: AU19990049827