Detector comprising transmission secondary electron emmission means

The present invention relates to ion detectors of the type used in scientific instrumentation, such as mass spectrometers. More particularly, the present invention provides a self-contained particle detector comprising an enclosure formed in part by a transmission mode secondary electron emissive el...

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Bibliographic Details
Main Authors JUREK, Russell, JONES, Antony, HUNTER, Kevin, WAKHLE, Aditya
Format Patent
LanguageEnglish
Published 20.01.2022
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Summary:The present invention relates to ion detectors of the type used in scientific instrumentation, such as mass spectrometers. More particularly, the present invention provides a self-contained particle detector comprising an enclosure formed in part by a transmission mode secondary electron emissive element, the enclosure defining an internal environment and an external environment, wherein the transmission mode secondary electron emissive element has an externally facing surface and an internally facing surface and is configured such that impact of a particle on the externally facing surface causes emission of one or more secondary electrons from the internally facing surface.
Bibliography:Application Number: AU20200287073