Sample testing systems and methods with automated cleaning

A sample testing system includes a test receptacle support structure, an optical element positioned for transmitting electromagnetic radiation emitted or reflected by a sample disposed in a test receptacle supported by the test receptacle support structure, a cleaning member, and an automated transp...

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Bibliographic Details
Main Authors OPALSKY, David, HAGEN, Norbert D, KNIGHT, Byron J
Format Patent
LanguageEnglish
Published 21.11.2019
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Summary:A sample testing system includes a test receptacle support structure, an optical element positioned for transmitting electromagnetic radiation emitted or reflected by a sample disposed in a test receptacle supported by the test receptacle support structure, a cleaning member, and an automated transport arm configured to (i) detachably couple the cleaning member, (ii) move the detachably-coupled cleaning member into a position proximate to and/or contacting the optical element, and (iii) decouple the cleaning member. 110 'w104 107 108 100 '*102
Bibliography:Application Number: AU20190257486