Imaging inspection apparatus

An imaging inspection apparatus (21) which utilizes a plurality of individual imaging inspection devices (23) (e.g., X-ray Computer Tomography scanning devices) positioned on a frame (53) for directing beams onto articles having objects therein to detect the objects based on established criteria. Th...

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Bibliographic Details
Main Authors JOHN E. KOZOL, FLETCHER L. CHAPIN
Format Patent
LanguageEnglish
Published 19.10.2006
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:An imaging inspection apparatus (21) which utilizes a plurality of individual imaging inspection devices (23) (e.g., X-ray Computer Tomography scanning devices) positioned on a frame (53) for directing beams onto articles having objects therein to detect the objects based on established criteria. The apparatus utilizes a conveyor (31) which is not physically coupled to the frame (53) having the imaging inspection devices (23) to pass the articles along a path of travel to an inspection location within the apparatus, whereupon the inspection devices (23) direct beams onto the article and the beams are detected and output signals provided to a processing and analysis assembly which analyzes the signals and identifies certain objects which meet the criteria. The conveyor can be folded when it is not conveying said articles.
Bibliography:Application Number: AU20060201089