INTERFEROMETER ALIGNMENT

The present invention provides means for correcting interferometer alignment errors through the use of corrective elements. The corrective elements allow reduced accuracy in the assembly process. Residual alignment errors caused by imprecise mounting of permanently mounted components can be correcte...

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Bibliographic Details
Main Author RUSSELL, E. ABBINK
Format Patent
LanguageEnglish
Published 13.08.2004
Edition7
Subjects
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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Summary:The present invention provides means for correcting interferometer alignment errors through the use of corrective elements. The corrective elements allow reduced accuracy in the assembly process. Residual alignment errors caused by imprecise mounting of permanently mounted components can be corrected using relatively low precision positioning of corrector components. The technique can be particularly applicable to the mass production of interferometers, for which achieving and maintaining the required assembly tolerances might otherwise be prohibitively expensive. Interferometers according to the present invention can be used, for example, in optical spectroscopy and in interferometers.
Bibliography:Application Number: AU20030293461