METHOD AND DEVICE FOR MEASURING THE DIFFUSION LENGTH OF MINORITY CARRIERS IN A SEMICONDUCTOR SAMPLE

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Bibliographic Details
Main Author UWE HERMES
Format Patent
LanguageEnglish
Published 02.12.2003
Edition7
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Bibliography:Application Number: AU20030236654