APPARATUS FOR INTERFACING ELECTRONIC PACKAGES AND TEST EQUIPMENT

A test apparatus for testing electrical devices such as ICs is provided. The test apparatus includes a test socket mounted on a DUT board in which a contact plunger assembly is at least partially positioned.

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Bibliographic Details
Main Authors JOHN, C. BERGERON, JOHN, M. WINTER, LOURIE, M. SARCIONE, LARRE, H. NELSON
Format Patent
LanguageEnglish
Published 22.09.2003
Edition7
Subjects
BASIC ELECTRIC ELEMENTS
CURRENT COLLECTORS
ELECTRICITY
LINE CONNECTORS
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:A test apparatus for testing electrical devices such as ICs is provided. The test apparatus includes a test socket mounted on a DUT board in which a contact plunger assembly is at least partially positioned.
Bibliography:Application Number: AU20030220023