VERFAHREN ZUM ABSCHLEIFEN VON HALBLEITER-WAFERN, ABSCHLEIFSPLATTE UND ABSCHLEIFUNGSVORRICHTUNG

A method of grinding semiconductor wafers including simultaneously grinding both surfaces of multiple semiconductor wafers by rotating the wafers between a pair of upper and lower rotating surface plates in a state where the wafers are held on a carrier so that centers of the wafers are positioned o...

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Bibliographic Details
Main Authors HASHII, TOMOHIRO, KAKIZONO, YUICHI, YAMADA, YASUNORI
Format Patent
LanguageGerman
Published 15.09.2011
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Summary:A method of grinding semiconductor wafers including simultaneously grinding both surfaces of multiple semiconductor wafers by rotating the wafers between a pair of upper and lower rotating surface plates in a state where the wafers are held on a carrier so that centers of the wafers are positioned on a circumference of a single circle, wherein a ratio of an area of a circle passing through the centers of the wafers to an area of one of the wafers is greater than or equal to 1.33 but less than 2.0; surfaces of the fixed abrasive grains comprised in the surface plates are comprised of pellets disposed in a grid-like fashion, with the pellets provided in a center portion and pellets provided in a peripheral portion being larger in size than the pellets provided in an intermediate portion.
Bibliography:Application Number: AT20090161073T