VERFAHREN ZUM NACHWEIS VON ANALYTEN MIT HILFE VON HALBLEITERNANOKRYSTALLEN

• Main Authors: PHILLIPS, VINCE, ZEHNDER, DONALD, WONG, EDITH, DANIELS, R, BRUCHEZ, MARCEL, EMPEDOCLES, STEPHEN
• Format: Patent
• Language: German
• Published: 15.08.2009
• Subjects: APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM]; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; SCANNING-PROBE TECHNIQUES OR APPARATUS; TESTING

The use of semiconductor nanocrystals as detectable labels in various chemical and biological applications is disclosed. The methods find use for detecting a single analyte, as well as multiple analytes by using more than one semiconductor nanocrystal as a detectable label, each of which emits at a...