VERFAHREN ZUM NACHWEIS VON ANALYTEN MIT HILFE VON HALBLEITERNANOKRYSTALLEN

The use of semiconductor nanocrystals as detectable labels in various chemical and biological applications is disclosed. The methods find use for detecting a single analyte, as well as multiple analytes by using more than one semiconductor nanocrystal as a detectable label, each of which emits at a...

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Bibliographic Details
Main Authors PHILLIPS, VINCE, ZEHNDER, DONALD, WONG, EDITH, DANIELS, R, BRUCHEZ, MARCEL, EMPEDOCLES, STEPHEN
Format Patent
LanguageGerman
Published 15.08.2009
Subjects
APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM]
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
SCANNING-PROBE TECHNIQUES OR APPARATUS
TESTING
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Summary:The use of semiconductor nanocrystals as detectable labels in various chemical and biological applications is disclosed. The methods find use for detecting a single analyte, as well as multiple analytes by using more than one semiconductor nanocrystal as a detectable label, each of which emits at a distinct wavelength.
Bibliography:Application Number: AT20000928836T