Microstructural analysis and optoelectrical properties of Cu 2O, Cu 2O–Ag, and Cu 2O/Ag 2O multilayered nanocomposite thin films
Cu 2O, Cu 2O–Ag nanocomposite, and Cu 2O/Ag 2O multilayered thin films were prepared by DC-reactive magnetron sputtering on glass substrates. After deposition, the microstructure of the films was examined using X-ray diffractometry and transmission electron microscopy (TEM). An incident-photon-conve...
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Published in | Thin solid films Vol. 519; no. 15; pp. 5169 - 5173 |
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Main Authors | , , |
Format | Journal Article |
Language | English |
Published |
Elsevier B.V
2011
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Subjects | |
Online Access | Get full text |
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Summary: | Cu
2O, Cu
2O–Ag nanocomposite, and Cu
2O/Ag
2O multilayered thin films were prepared by DC-reactive magnetron sputtering on glass substrates. After deposition, the microstructure of the films was examined using X-ray diffractometry and transmission electron microscopy (TEM). An incident-photon-conversion-efficiency (IPCE) system was used to characterize the opto-electrical properties of these films. The TEM study reveals that Cu
2O–Ag nanocomposite consists of Cu
2O, Ag
2O, and small amount of Ag phases. The coupling of the Ag
2O phase with Cu
2O can enhance light absorption and create more electron-hole pairs due to the small band gap of Ag
2O. Furthermore, the composite band structure can cause the increased carrier density by enhancing electron-hole separation. The multilayered Cu
2O/Ag
2O films also show similar results to Cu
2O–Ag although not as outstanding. |
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ISSN: | 0040-6090 1879-2731 |
DOI: | 10.1016/j.tsf.2011.01.081 |