Microstructural analysis and optoelectrical properties of Cu 2O, Cu 2O–Ag, and Cu 2O/Ag 2O multilayered nanocomposite thin films

• Published in: Thin solid films Vol. 519; no. 15; pp. 5169 - 5173
• Main Authors: Tseng, C.C., Hsieh, J.H., Wu, W.
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 2011
• Subjects: Cu 2O/Ag 2O multilayer thin films; Cu 2O–Ag nanocomposite; IPCE; Multilayer thin films; Opto-electrical properties; Opto-electronic properties; TEM; Opto-electrical properties; Opto-electronic properties; Cu 2O/Ag 2O multilayer thin films; IPCE; Multilayer thin films; TEM; Cu 2O–Ag nanocomposite
• ISSN: 0040-6090; 1879-2731
• DOI: 10.1016/j.tsf.2011.01.081

Cu 2O, Cu 2O–Ag nanocomposite, and Cu 2O/Ag 2O multilayered thin films were prepared by DC-reactive magnetron sputtering on glass substrates. After deposition, the microstructure of the films was examined using X-ray diffractometry and transmission electron microscopy (TEM). An incident-photon-conversion-efficiency (IPCE) system was used to characterize the opto-electrical properties of these films. The TEM study reveals that Cu 2O–Ag nanocomposite consists of Cu 2O, Ag 2O, and small amount of Ag phases. The coupling of the Ag 2O phase with Cu 2O can enhance light absorption and create more electron-hole pairs due to the small band gap of Ag 2O. Furthermore, the composite band structure can cause the increased carrier density by enhancing electron-hole separation. The multilayered Cu 2O/Ag 2O films also show similar results to Cu 2O–Ag although not as outstanding.